Characterisation - Material Assessment: Wafer Technology
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Wafer Technology Ltd

34 Maryland Road
Milton Keynes
MK15 8HJ
United Kingdom

+44 (0)1908 210444

+44 (0)1908 210443


Wafer Technology employs a comprehensive set of materials characterisation tools to ensure full conformity of product supplied.  All assessment is managed according to ISO9001:2000 certified quality control systems.

Surface and Flat Orientation X-Ray Diffraction
(Bede Triple Axis Diffractometer)
Defect Density Etching and microscopy

Bulk Properties
Carrier concentration Keithley Automatic Hall Test System
Mobility As above
Resistivity As above
Purity GDMS analysis

Dimensional Control
Flat lengths Mitutoyo Optical Comparitor
Diameter As Above
Edge Profile As Above
Thickness Hoverprobe
(TTV, TIR, Bow, Warp)
Tropel Autoselect

Polish Quality
Texture Nomarski microscope
Sub-surface damage ETOCAP
Haze and Particulates Tencor Surfscan 6220
Collimated Light Inspection
Surface composition SIMS
'Epi-ready' performance MOCVD and MBE

As a member of IQE plc, Wafer Technology’s characterisation portfolio also extends to the regular use of an extensive Group metrology service which is comprised of many state-of-the-art wafer assessment tools. These include advanced surface analysis by atomic force microscopy (Veeco Digital Instruments DI3100) and 3D surface profilometry (Taylor Hobson Talysurf CCI 3000). Electrical assessments are made using contactless sheet resistance (Lehighton LEI 1500RS) and layer thickness determinations by infra-red microscopy (Film Expert MKS 2140). Metrology is a critical aspect of product conformity and together with our own in-house range of assessment tools enables us to deliver the highest quality of product.

Please contact us if you would like to discuss a bespoke range of further wafer characterisation options.